论文期刊

An approach for calculating arbitrary-order diffraction through hole-array based on thin microcavity theory




作者: Xu Chen, Jiu Hui Wu, Pei Cao
发表/完成日期: 2018-09-30
期刊名称: Optics Communications
期卷: Vol.433, 2019
相关文章: An approach for calculating arbitrary_order diffraction through hole_array based on thin microcavity theory_Optics_Communications_ChenXu.pdf   
论文简介
An approach for calculating the optical diffraction coefficients through a subwavelength hole-array embedded
in a suspending thin metal layer is investigated based on the rigorous coupled wave analysis method and thin
microcavity theory. In this approach, the electromagnetic field components in the reflected and transmitted
regions and diffraction coefficients of arbitrary orders are derived, respectively, and some enhanced diffraction
phenomena are discussed in detail, which are then verified via finite element (FE) simulation. Subsequently,
the effects of structural and material parameters of holey thin film including film material, incident angle, hole
geometry, and duty cycle of periodic array layer on the transmittance are analyzed. The relevant results show that
the duty cycle is the main influence factor, and with the suitable duty cycle the optical transmittance through the
free-standing metal layer can be enhanced as high as 0.8 in the visible region. All these findings may be utilized
in the wavelength tuning of subwavelength optics.