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Paper

Paper Name    A novel Single Event Upset hardened CMOS SRAM cell
Author    Guohe Zhang， Jun Shao， Feng Liang*， Dongxuan Bao
Publication/Completion Time    2012-02-01
Magazine Name    IEICE Electronics Express
Vol    9（3）
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Paper description    A novel Single Event Upset hardened CMOS SRAM cell
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