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刘甫

副教授

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  • 电子邮箱:
  • 所在单位: 电子科学与工程学院
  • 学历: 博士研究生毕业
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  • 性别: 男
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  • 学位: 博士
  • 博士生导师: 是
  • 硕士生导师: 是
  • 学科: 电子科学与技术

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Our paper on calculating SE evolution using DA method was published in Micron

发布时间:2024-01-18
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发布时间:
2024-01-18
文章标题:
Our paper on calculating SE evolution using DA method was published in Micron
内容:

Our paper H. Hu, M. Li, J. Hu, F. Liu*, and Y. Kang*, "A calculation approach for current density distribution evolution of secondary electrons using differential algebra method" was published in Micron.

 

Abstract:

In this study, the concept of the current density distribution (CDD) evolution of secondary electron (SE) beam is presented, and a novel approach using the differential algebra (DA) method is proposed to calculate the CDD evolution of the SE beam. Firstly, the emitted SE beam is divided into some beamlets in polar and azimuth angle directions. For each beamlet only one reference trajectory is traced using DA method. As a result, the transfer properties for this beamlet are obtained. Using the transfer properties, the current density function at arbitrary plane for the beamlet can be derived, in which the initial angle distribution, energy distribution and emission source size are considered. And then, the current density function is integrated, resulting in the CDD of this beamlet at arbitrary plane. Finally, the CDD evolution of the whole SE beam is obtained by superposing the CDDs of all beamlets. As an example, a SE detection system for a scanning electron microscope (SEM) is calculated using the proposed approach and therefore the SE CDD evolution is obtained and analyzed. Furthermore, experiments for observing the SE image of detector are performed, and the calculated SE CDD and the corresponding simulation images well explained the experimental results, validating the proposed calculation method. The proposed approach can be potentially applied for optimizing the SE detection system and therefore improving the collection efficiency of SE.

 

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DOI: https://doi.org/10.1016/j.micron.2024.103592