恭喜程卓林和侯宗克的论文Steadily decreasing power loss of double Schottky barrier originated from the dynamics of mobile ions with stable interface states被知名期刊Physical Review Applied接收！

A general ageing model of the double Schottky barrier was proposed to unveil the long-term ageing behaviors of ZnO varistor ceramics, especially for those ones with steadily decreasing power loss. For those samples, the barrier height and electrical properties were even enhanced rather than commonly deteriorated, which was contradictory to the prediction of classic ion migration model. In this paper, a unique characteristic of them during the ageing was found that they were capable to totally recover to their initial unaged state. It indicated that this kind of ageing was essentially a reversible process, in which stable interface states played a significant role. On this basis, the controversial major mobile ions were further identified to be Zni· ions, which made it possible to quantify dynamics of depletion layers. Continuously increasing power loss was generated if the mobile ions migrated to grain boundary and combined with the interface states under the external electric field. However, if the interface states were not combined with those mobile ions, a "U-shape" ion spatial distribution would be formed in the depletion layers as a result of ion migration and diffusion. Only in this situation could a reduction in the depletion-layer/interfacial charge, a rise in the depletion layer width, and a increase in the barrier height be simultaneously achieved. The steadily decreasing power loss caused by the elevated barrier height was consequently detectable. Therefore, a general mechanism on ageing of the double Schottky barrier was unveiled that it was a competition process between consumption of the interface states and the dynamics of mobile ions in depletion layers.

稳定型ZnO压敏陶瓷功耗持续下降的实验(左)及仿真(右)结果

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