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Paper Name | A Low Power Test Pattern Generator for BIST |
Author | Lei SC, Feng L(梁峰), Liu ZY(刘泽叶), Wang XY(王晓瑛) |
Publication/Completion Time | 2010-05-04 |
Magazine Name | IEICE Trans. Electronics |
Vol | 2010,05 |
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Paper description | A Low Power Test Pattern Generator for BIST 2010.5. ISSN : 17451353 IEICE Trans. Electronics SCI 第一作者 SCI: 643ZZ |