雷绍充的个人主页空间 - 雷 绍充
| Paper Name | Explore the Limits to Reduce Test Power |
| Author | Lei SC, Jiang ZW, and D M H Walker |
| Publication/Completion Time | 2008-10-31 |
| Magazine Name | IEEE D3T-2008 |
| Vol | |
| Related articles | |
| Paper description | Lei SC（雷绍充）, Jiang ZW, and Walker D M H. Explore the Limits to Reduce Test Power [R]. IEEE International Workshop on Defect and Data Driven Testing (D3T-2008), October 30 - 31, 2008, Santa Clara, CA, USA. http://dbt.tttc-events.org/ |
(创新港)
