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论文期刊

论文标题    Explore the Limits to Reduce Test Power
作者    Lei SC, Jiang ZW, and D M H Walker
发表/完成日期    2008-10-31
期刊名称    IEEE D3T-2008
期卷   
相关文章   
论文简介    Lei SC（雷绍充）, Jiang ZW, and Walker D M H. Explore the Limits to Reduce Test Power [R]. IEEE International Workshop on Defect and Data Driven Testing (D3T-2008), October 30 - 31, 2008, Santa Clara, CA, USA. http://dbt.tttc-events.org/
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