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论文期刊

论文标题    Test patterns of multiple SIC vectors: theory and application in BIST schemes
作者    梁峰Feng Liang; Luwen Zhang; Shaochong Lei; 等
发表/完成日期    2013-04-05
期刊名称    IEEE Trans. on VLSI
期卷    卷: 21 期: 4 页: 614-23
相关文章   
论文简介    标题: Test patterns of multiple SIC vectors: theory and application in BIST schemes 作者: Feng Liang; Luwen Zhang; Shaochong Lei; 等. 来源出版物: IEEE Transactions on Very Large Scale Integration (VLSI) Systems 卷: 21 期: 4 页: 614-23 DOI: 10.1109/TVLSI.2012.2195689 出版年: April 2013
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