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论文期刊

论文标题    A unified solution to reduce test power and test volume for Test-per-scan schemes
作者    Shaochong Lei, Zhen Wang(王震), Zeye Liu(刘泽叶)
发表/完成日期    2010-09-09
期刊名称    IEICE Electronics Express
期卷    2010.9
相关文章   
论文简介    SCI: 655ED
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