Paper

Paper Name    A Low Power Test Pattern Generator for BIST
Author    Lei SC, Feng L(梁峰), Liu ZY(刘泽叶), Wang XY(王晓瑛)
Publication/Completion Time    2010-05-04
Magazine Name    IEICE Trans. Electronics
Vol    2010,05
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Paper description    A Low Power Test Pattern Generator for BIST 2010.5. ISSN : 17451353 IEICE Trans. Electronics SCI 第一作者 SCI: 643ZZ