Paper Name |
A unified solution to reduce test power and test volume for Test-per-scan schemes |
Author |
Shaochong Lei, Zhen Wang(王震), Zeye Liu(刘泽叶) |
Publication/Completion Time |
2010-09-09 |
Magazine Name |
IEICE Electronics Express |
Vol |
2010.9 |
Related articles |
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Paper description |
SCI: 655ED |