雷绍充的个人主页空间 - 雷 绍充
Paper Name | Explore the Limits to Reduce Test Power |
Author | Lei SC, Jiang ZW, and D M H Walker |
Publication/Completion Time | 2008-10-31 |
Magazine Name | IEEE D3T-2008 |
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Paper description | Lei SC(雷绍充), Jiang ZW, and Walker D M H. Explore the Limits to Reduce Test Power [R]. IEEE International Workshop on Defect and Data Driven Testing (D3T-2008), October 30 - 31, 2008, Santa Clara, CA, USA. http://dbt.tttc-events.org/ |