雷绍充的个人主页空间 - 雷 绍充
论文标题 | Explore the Limits to Reduce Test Power |
作者 | Lei SC, Jiang ZW, and D M H Walker |
发表/完成日期 | 2008-10-31 |
期刊名称 | IEEE D3T-2008 |
期卷 | |
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论文简介 | Lei SC(雷绍充), Jiang ZW, and Walker D M H. Explore the Limits to Reduce Test Power [R]. IEEE International Workshop on Defect and Data Driven Testing (D3T-2008), October 30 - 31, 2008, Santa Clara, CA, USA. http://dbt.tttc-events.org/ |