Multi-wavelength pinhole point diffraction interferometry for optics metrology with interferometric intensity based phase retrieval method
发布时间:2026-09-18
点击次数:
- 发布时间:
- 2026-09-18
- 论文名称:
- Multi-wavelength pinhole point diffraction interferometry for optics metrology with interferometric intensity based phase retrieval method
- 发表刊物:
- Optics and Lasers in Engineering
- 合写作者:
- Li B, et al.
- 第一作者:
- Geng L
- 论文类型:
- 期刊论文
- 通讯作者:
- Zhao Z
- 卷号:
- 178
- 页面范围:
- 108198
- 是否译文:
- 否
- 发表时间:
- 2024-01-01




