A single input change test pattern generator for sequential circuits
- 发布时间:2025-04-30
- 论文名称:A single input change test pattern generator for sequential circuits
- 发表刊物:IEICE TRANSACTIONS ON ELECTRONICS
- 摘要:An optimized Built-In Self-Test technology is proposed in this paper. A simplified algebraic model is developed to represent the configurations of single input change circuits. A novel single input change sequence generation technique is designed. It consists of a modified scan shift register, a seed storage array and a series of XOR gates. This circuitry can automatically generate single input change sequences of more unique vectors. Experimental results based on the ISCAS-89 benchmark show that the proposed method can achieve high stuck-at fault coverage with low switching activity during test applications.
- 合写作者:Liang, Feng; Lei, ShaoChong; Shao, ZhiBiao
- 卷号:8; E91C
- 页面范围:1365-1370
- 是否译文:否
- 发表时间:2008-08-01
- 合写作者:Liang, Feng; Lei, ShaoChong; Shao, ZhiBiao