A novel Single Event Upset hardened CMOS SRAM cell
- 发布时间:2025-04-30
- 论文名称:A novel Single Event Upset hardened CMOS SRAM cell
- 发表刊物:IEICE Electronics Express
- 摘要:A novel Single Event Upset hardened CMOS SRAM cell
- 合写作者:Guohe Zhang, Jun Shao, Feng Liang*, Dongxuan Bao
- 卷号:9(3)
- 页面范围:140-145
- 是否译文:否
- 发表时间:2012-02-01
- 合写作者:Guohe Zhang, Jun Shao, Feng Liang*, Dongxuan Bao