梁峰
- 教授
- 博士生导师
- 硕士生导师
- 性别：男
- 学历：博士研究生毕业
- 学位：博士
- 所在单位：微电子学院
- 电子邮箱：
- 办公地点：
- 联系方式：
- 学科：电子科学与技术
- 学科：电子科学与技术
A test pattern generation method with high compression ratio
- 发布时间：2025-04-30
- 论文名称：A test pattern generation method with high compression ratio
- 发表刊物：IEICE ELECTRONICS EXPRESS
- 摘要：This paper proposes a test pattern generation and compression method to reduce test volume for VLSI testing. Unlike traditional approaches, the proposed scheme predefines linear relationships between vectors or within a vector of a test sequence firstly. Then, it determines test patterns by fault simulation. Therefore, patterns of a deterministic test set keep the predefined linear relationships, and can be highly compressed. Simulation results on ISCAS＇89 benchmarks demonstrate that the proposed method can significantly reduce the data size with high fault coverage.
- 合写作者：Liang, Feng; Zhang, Luwen; Lei, Shaochong
- 卷号：21,8
- 页面范围：1842-1847
- 是否译文：否
- 发表时间：2011-11-01
- 合写作者：Liang, Feng; Zhang, Luwen; Lei, Shaochong