null

论文期刊

论文标题    Test Patterns of Multiple SIC Vectors: Theory and Application in BIST Schemes
作者    Feng Liang，Luwen Zhang，Shaochong Lei，Guohe Zhang*，Kaile Gao，Bin Liang
发表/完成日期    2013-04-01
期刊名称    IEEE Transactions on very Large Scale Integradion (VLSI) Systems
期卷    21(4)
相关文章   
论文简介    This paper proposes a novel test pattern generator (TPG) for built-in self-test. Our method generates multiple singleinput change (MSIC) vectors in a pattern, i.e., each vector applied to a scan chain is an SIC vector. A reconfigurable Johnson counter and a scalable SIC counter are developed to generate a class of minimum transition sequences. The proposed TPG is flexible to both the test-per-clock and the test-per-scan schemes. A theory is also developed to represent and analyze the sequences and to extract a class of MSIC sequences. Analysis results show that the produced MSIC sequences have the favorable features of uniform distribution and low input transition density. The performances of the designed TPGs and the circuits under test with 45 nm are evaluated. Simulation results with ISCAS benchmarks demonstrate that MSIC can save test power and impose no more than 7.5% overhead for a scan design. It also achieves the target fault coverage without increasing the test length.
返回