祝贺王鹤文章被IEEE Electron Device Letters接收 - 首页 - 刘 明
祝贺王鹤文章被IEEE Electron Device Letters接收
"Ferromagnetic Resonance of Single-Crystalline La0.67Sr0.33MnO3 Thin Film Integrated on Silicon"
H. Wang, L. K. Shen, L. Lu, B. Zhang, C. R. Ma, C. M. Cao, C. J. Jiang, M. Liu, C. L. Jia
IEEE Electron Device Letters, 2019, Accepted.
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