Defect levels in d-electron containing systems: Comparative study of CdTe using LDA and LDA + U
Release Time:2026-06-12
Hits:
- Date:
- 2026-06-12
- DOI Number:
- 10.1088/1674-4926/41/10/102701
- Title of Paper:
- Defect levels in d-electron containing systems: Comparative study of CdTe using LDA and LDA + U
- Journal:
- Journal of Semiconductors
- Co-author:
- Yu Wang, Guangde Chen,Yelong Wu
- First Author:
- Yuan Yin
- Volume:
- 41
- Issue:
- 10
- Page Number:
- 102701
- ISSN:
- 1674-4926
- Translation or Not:
- No
- Date of Publication:
- 2020-10-01
- Links to Published Journals:
- https://iopscience.iop.org/article/10.1088/1674-4926/41/10/102701




