梁峰
- 教授
- 博士生导师
- 硕士生导师
- 性别：男
- 学历：博士研究生毕业
- 学位：博士
- 所在单位：微电子学院
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- 学科：电子科学与技术
- 学科：电子科学与技术
A unified solution to reduce test power and test volume for Test-per-scan schemes
- 发布时间：2025-04-30
- 论文名称：A unified solution to reduce test power and test volume for Test-per-scan schemes
- 发表刊物：IEICE ELECTRONICS EXPRESS
- 摘要：This paper proposes a unified solution to reduce test power and test volume for test-per-scan schemes. With the self-testing using MISR and Parallel SRSG (STUMPS) architecture and the developed reconfigurable Johnson counter, the proposed test pattern generator (TPG) applies two transition sequences to all scan chains, and the primary inputs of the circuit under test (CUT) keep unchanged at most times. Therefore, the switching activities both in the combinational block and in scan chains can be reduced simultaneously. If the generated test vectors that do not contribute to fault coverage are filtered out, the remaining deterministic patterns show the favorable features of high compressible and low-test power. Simulation results on ISCAS＇89 benchmarks demonstrate that the proposed TPG imposes negligible impact on test length and power overhead of the CUT.
- 合写作者：Lei, Shaochong; Wang, Zhen; Liu, Zeye; Liang, Feng*
- 卷号：7,18
- 页面范围：1364-1369
- 是否译文：否
- 发表时间：2010-07-01
- 合写作者：Lei, Shaochong; Wang, Zhen; Liu, Zeye; Liang, Feng*