A Method to Characterize the Shrinking of Safe Operation Area of Metallized Film Capacitor Considering Electrothermal Coupling and Aging in Power Electronics Applications
- 发布时间:2025-04-30
- 论文名称:A Method to Characterize the Shrinking of Safe Operation Area of Metallized Film Capacitor Considering Electrothermal Coupling and Aging in Power Electronics Applications
- 发表刊物:IEEE Transactions on Industrial Electronics
- 合写作者:C. Lv, J. Liu, Y. Zhang, et al.
- 卷号:70(2)
- 页面范围:1993-2002
- 是否译文:否
- 发表时间:2023-02-10
- 合写作者:C. Lv, J. Liu, Y. Zhang, et al.