吕春林
  • 助理教授
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  • 所在单位:电气工程学院
  • 学历:直博
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  • 学位:博士
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代表性成果
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[1] C. Lv, J. Liu, Y. Zhang, et al. A Method to Characterize the Shrinking of Safe Operation Area of Metallized Film Capacitor Considering Electrothermal Coupling and Aging in Power Electronics Applications[J]. IEEE Transactions on Industrial Electronics, 2023, 70(2):1993-2002.

[2] C. Lv, J. Liu, Y. Zhang, et al. A high-resolution analytical thermal modeling method of capacitor bank considering thermal coupling and different cooling modes[J]. IEEE Transactions on Power Electronics, 2023, 38(6): 7674-7684.

[3] C. Lv, J. Liu, Y. Zhang, et al. Reliability Modeling for Metallized Film Capacitors Based on Time-Varying Stress Mission Profile and Aging of ESR[J]. IEEE Journal of Emerging and Selected Topics in Power Electronics, 2021, 9(4):4311-4319.

[4] C. Lv, J. Liu, Y. Zhang,et al. An improved lifetime prediction method for metallized film capacitor considering harmonics and degradation process[J]. Microelectronics Reliability, 2020, 114: 113892.

[5] C. Lv, J. Liu, Y. Zhang, et al. A data-driven method for anomaly detection and aging model parameter estimation of capacitors based on condition monitoring[J]. Microelectronics Reliability, 2022, 138: 114646.

[6] 张岩,吕春林,杨跃,曹瑞,刘进军.基于任务剖面的金属化膜电容器加速寿命试验装置及方法[P]CN202011445904.72022-02-22

[7] 张岩,吕春林,曹瑞,刘进军.基于任务剖面与老化分析的金属化膜电容器寿命预测方法[P]CN202010010365.82022-04-22