An improved lifetime prediction method for metallized film capacitor considering harmonics and degradation process
- 发布时间:2026-07-21
- 论文名称:An improved lifetime prediction method for metallized film capacitor considering harmonics and degradation process
- 发表刊物:Microelectronics Reliability
- 合写作者:C. Lv, J. Liu, Y. Zhang,et al.
- 是否译文:否
- 收录刊物:SCI
- 合写作者:C. Lv, J. Liu, Y. Zhang,et al.