RTN-based defect tracking technique: Experimentally probing the spatial and energy profile of the critical filament region and its correlation with HfO2 RRAM switching operation and failure mechanism
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发布时间：2025-04-30
发布时间：2025-04-30
论文名称：RTN-based defect tracking technique: Experimentally probing the spatial and energy profile of the critical filament region and its correlation with HfO2 RRAM switching operation and failure mechanism
发表刊物：2016 IEEE Symposium on VLSI Technology
合写作者：Z. Chai, J. Ma, W. Zhang*, B. Govoreanu, E. Simoen, J. F. Zhang, Z. Ji, R. Gao, G. Groeseneken, M. Jurczak
是否译文：否
发表时间：2016-06-14