Reliability Modeling for Metallized Film Capacitors Based on Time-Varying Stress Mission Profile and Aging of ESR
- 发布时间:2026-07-21
- 论文名称:Reliability Modeling for Metallized Film Capacitors Based on Time-Varying Stress Mission Profile and Aging of ESR
- 发表刊物:IEEE Journal of Emerging and Selected Topics in Power Electronics
- 合写作者:C. Lv, J. Liu, Y. Zhang, et al.
- 是否译文:否
- 收录刊物:SCI
- 合写作者:C. Lv, J. Liu, Y. Zhang, et al.