Probing the Critical Region of Conductive Filament in Nanoscale HfO2 Resistive-Switching Device by Random Telegraph Signals
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发布时间：2025-04-30
发布时间：2025-04-30
论文名称：Probing the Critical Region of Conductive Filament in Nanoscale HfO2 Resistive-Switching Device by Random Telegraph Signals
发表刊物：IEEE Transactions on Electron Devices
合写作者：Zheng Chai; Jigang Ma; Wei Dong Zhang; Bogdan Govoreanu; Jian Fu Zhang; Zhigang Ji; Malgorzata Jurczak
卷号：Volume: 64, Issue: 10
页面范围：4099 - 4105
是否译文：否
发表时间：2017-08-29