Objective-Based Low-Frequency Parasitic Inductance Characterization Method for Power Semiconductor Package With High Power and Switching Speed
发布时间：2025-11-23
点击次数：
- 发布时间：
- 2025-11-23
- 论文名称：
- Objective-Based Low-Frequency Parasitic Inductance Characterization Method for Power Semiconductor Package With High Power and Switching Speed
- 发表刊物：
- IEEE TRANSACTIONS ON POWER ELECTRONICS
- ISSN号：
- 0885-8993
- 是否译文：
- 否
- 收录刊物：
- SCI